Proposal Submission to Beamline
Proposal Submission to Beamline
Proposal Submission
This page provides an overview of the steps involved in preparing, submitting, and carrying out an experiment on BL8. Please explore the sub-sections for detailed guidance. If you have any questions or require additional information, you are encouraged to contact the BL8 beamline staff for assistance.
Access Routes
Synchrotron Thailand runs three main Calls for Proposals each year. Proposals submitted via this route are evaluated by an independent peer review panel and successful applicants are allocated beamtime in the regular schedule. We strongly recommend contacting BL8 beamline staff before submission to discuss feasibility and the most suitable experimental configuration.
How to apply: submit your proposal through the official user application system and follow the deadlines listed on the Synchrotron Thailand website. For pre-submission advice, contact the Proposals Office.
Rapid Access is intended for short, urgent, or time-sensitive ex-situ experiments, for example, proof of concept measurements or quick data required for responding to referees. Rapid Access requests are considered outside the main Calls and are assessed on a case-by-case basis.
How to apply / who to contact: contact the Head, X-ray Spectroscopy section or beamline staff prior to submitting a Rapid Access request so the team can advise on feasibility and prioritization. All Rapid Access applications must be submitted through the user application system.
Sample Measurement Time at Beamline 8
XAS / XRF Technique
| XANES | EXAFS | |
|---|---|---|
| Standard Transmission measurements |
E: -100, -20, 80, 200 E step: 5, 0.2, 5 → ~14 min/scan E step: 5, 0.3, 5 → ~9 min/scan (for 2 scans) |
E: -200, -10, 20, 14k E step: 10, 0.2, 0.05k → ~12 min/scan E step: 10, 0.3, 0.05k → ~10 min/scan (for 2 – 3 scans) |
| Standard Fluorescence measurements | 15 – 30 min/scan (depending on time and step) | ~25 – 50 min/scan (depending on time and step) |
System Setup Time
- Changing the energy-selecting crystal: 2 – 3 hours
- Changing the energy range for measurement: approximately 1 hour
- Installing auxiliary equipment or in situ measurement setups: about 2 hours
XFI Technique
For XRF imaging, the acquisition time for one sample is approximately 8 hours, depending on the concentration of the target elements. Within one shift, it is generally possible to image up to two samples at most.