Investigates local atomic structure and electronic states by analyzing X-ray absorption patterns.

Captures dynamic changes in electronic and structural properties over time.

Combines XAS with micro-focused beams for localized structural analysis.

Surface-sensitive absorption spectroscopy for thin films and interfaces.

Determines elemental composition by detecting characteristic X-ray emissions.

Ultra-trace elemental analysis using total reflection geometry with very low detection limits.

Identifies chemical bonds and functional groups using infrared absorption spectra.

Analyzes electronic structure by detecting photoelectrons.

Quantifies elemental composition and chemical states within the top nanometers via core-level photoemission.

Depth-sensitive XPS using emission angle to separate surface and near-surface information and probe anisotropy.

Studies electronic structure by measuring photoelectrons emitted from a sample.

Probes electronic band structure by measuring photoelectrons emitted at different angles.

Studying orientation-dependent absorption.

Near-edge region of XAS sensitive to bonding, functional groups, and molecular orientation.

Spatially resolved XPS providing micron-scale chemical state mapping for surfaces.

Probes the electronic band structure with high spatial resolution, enabling microscale analysis.

Electron Energy Loss Spectroscopy at microscopic scale to probe electronic structure and chemical composition.

High-resolution NEXAFS imaging for mapping molecular orientation and bonding.

NEXAFS detected via Auger yield with micron spatial resolution for chemical state mapping.