State of the art tool for refinement of atomic and structural parameters
- Utilization of parallel and intense synchrotron x-rays for increased angular resolution, faster measurements and small beam size XRD experiments.
- Preferred XRD configuration for structural refinement without effects of sample displacement and preferred orientation.
- Combined complementary XRD, XAS and XRF techniques for multi-probe approach of structural determination including in-situ experiments under elevated temperature and controlled atmosphere.
Surface sensitive structure of thin films and coating
- Available grazing incidence (GI) setup for investigation of phases, purities and preferred crystallite orientation of thin films and coatings on substrates.
- Help design thin-film fabrication process and examine structural and chemical functions of films.
Anomalous x-ray diffraction for spinel site occupancy
- X-ray diffraction measurements as a funtion of energy offers spectroscopic information that is crystallographic phase sensitive or crystallographic site sensitive.
- Site occupancies of doped elements in spinel determined when x-ray energy is varied in the vicinity of the doped elements absorption edges.
Chemical forms of heavy metal in environment
- Identification of toxic chemical forms of heavy metal such as arsenic, mercury and lead in soil, water and affected marine animal and plant.
- Finding solutions to reduce heavy metal contamination to people, livestock and foods.
Local probe for trace elements in gemology materials
- Oxidation state identification of trace amounts of transition metal ions responsible for colors in gemstones.
- Available XAS UV-Vis coupling set up under elevated temperatures from patented Octagon furnace for real-time tracking of oxidation state and light absorbance change during heat treatment.
Chemical changes during electrochemical reaction
- Chronoamperometry and XAS coupling setup for monitoring of complex formation between metal ions and organic ligands.
- Identification of the effects of controlled potential to changes of oxidation states and chemical species.
- Help determine key steps and controlled parameters required for electrochemical reactions.
Synchrotron XRF for increased sensitivity and spatial resolution
- A choice for non-destructive probe for qualitative or quantitative elemental analysis applicable to most materials including organic or inorganic and in solid or liquid forms.
- Increased sensitivity and spatial resolution provide opportunities for small samples, inhomogeneous samples or detection of low concentration constituents.
|Prae Chirawatkul, PhD
|Chatree Saiyasombat, PhD
|Suttipong Wannapaiboon, PhD