Beamline 1.1W
Multiple X-ray Techniques (XRD · XAS · XRF)
BL1.1W Multiple X-ray Techniques (XRD · XAS · XRF)
The Beamline 1.1W consists of three beamline end-stations, namely, X-ray diffraction (XRD), X-ray absorption spectroscopy (XAS) and X-ray fluorescence (XRF). A combination of the three techniques provides structural information on the long-range order, as seen by the XRD technique, as well as local structures as seen by the XAS technique and elemental analysis from the XRF technique. The ability to combine multiple X-ray techniques is highly useful especially for in-situ study, as various information can be extracted when samples are subjected to the same environment.
Photon energy
4 – 18 keV
Photon flux
107 – 108
phs/s/0.1%bw @100 mA
Energy resolution
10−4
Si(111) DCM
Beam size (H×V)
6 × 3 mm
Experimental Techniques
X-ray Diffraction (XRD)
XRD- Crystal phase
- Refined crystal parameters and atomic positions
- Structural orientation
- Crystallinity
- Crystallite size
- Residual stress
X-ray Absorption Spectroscopy (XAS)
XAS- Oxidation state
- Symmetry
- Local coordination environment
- Speciation
X-ray Fluorescence (XRF)
XRF- Qualitative and quantitative elemental analysis
Research Opportunities
What you can do at BL1.1W with combined XRD, XAS and XRF.
State-of-the-art tool for refinement of atomic and structural parameters
- Parallel and intense synchrotron X-rays for increased angular resolution, faster measurements and small-beam XRD experiments.
- Preferred XRD configuration for structural refinement without effects of sample displacement and preferred orientation.
- Complementary XRD, XAS and XRF for a multi-probe approach to structure determination, including in-situ experiments under elevated temperature and controlled atmosphere.
Surface-sensitive structure of thin films and coatings
- Grazing incidence (GI) setup for investigating phases, purities and preferred crystallite orientation of thin films and coatings on substrates.
- Helps design thin-film fabrication processes and examine structural and chemical functions of films.
Anomalous X-ray diffraction for spinel site occupancy
- XRD measured as a function of energy gives spectroscopic information that is crystallographic-phase or site sensitive.
- Site occupancies of dopants in spinel are determined by varying the X-ray energy near the dopant absorption edges.
Chemical forms of heavy metals in the environment
- Identification of toxic chemical forms of heavy metals such as arsenic, mercury and lead in soil, water, and affected marine animals and plants.
Local probe for trace elements in gemology materials
- Oxidation-state identification of trace transition-metal ions responsible for colors in gemstones.
- XAS–UV-Vis coupling setup with the patented Octagon furnace for real-time tracking of oxidation state and light absorbance during heat treatment.
Chemical changes during electrochemical reactions
- Chronoamperometry–XAS coupling setup for monitoring complex formation between metal ions and organic ligands.
- Identifies how controlled potential changes oxidation states and chemical species.
- Helps determine key steps and control parameters of electrochemical reactions.
Synchrotron XRF for increased sensitivity and spatial resolution
- Non-destructive qualitative or quantitative elemental analysis for most materials, organic or inorganic, solid or liquid.
- Higher sensitivity and spatial resolution suit small or inhomogeneous samples and low-concentration constituents.