The beamline 3.2Ua/b is a facility designed for the study of atomic elements, chemical states, and electronic structures of surfaces and interfaces based on Photoemission Spectroscopy (PES). The beamline provides an intense and highly monochromatic beam of vacuum ultraviolet to soft X-ray radiation, with photon energies ranging from 40 to 160 and 220 to 1040 eV, corresponding to an electron mean free path of 0.5 to 2 nm. There are three end stations, at 3.2Ua: 1) Angle-Resolved Photoemission Spectroscopy (ARPES end station) and 2) Soft X-ray Angle-Integrated Photoemission Spectroscopy (XPS end station). The techniques using synchrotron radiation at 3.2Ua consist of ARPES, XPS, UPS, NEXAFS, ARXPS, and ARXAS (including Magic Angle XAS). At 3.2Ub: 3) Photoemission Electron Microscope (PEEM end station). The techniques at 3.2Ub include PEEM, PEEM-IV, ARPES, micro-ARPES, image-XPS, micro-XPS, image-NEXAFS, Auger-yield micro NEXAFS, Work function mapping, LEED-IV, LEEM, micro-EELS, Bright and Dark field LEEM. Each station operates in an ultra-high vacuum (UHV) environment within the experiment chamber.

End Stations

BL3.2Ua

Angle-resolved Photoemission Spectroscopy (ARPES)

BL3.2Ua

X-ray Photoemission Spectroscopy (XPS)

BL3.2Ub

Photoemission Electron Microscope (PEEM)