สถาบันวิจัยแสงซินโครตรอน (องค์การมหาชน)

font size:

Social:

Technology / Beamline System / Beamline 2.2W

Experimental-station

experimental-station

Experimental Station

The primary advantage of the TRXAS end-station is its ability to record complete X-ray absorption spectra simultaneously and rapidly. This makes it an ideal tool for in-situ measurements to monitor structural and electronic changes in samples under various environmental conditions, such as high temperature, pressure, or specific gas atmospheres.

In-situ Environmental System

Currently, the institute provides a specialized Heating Cell designed to support a wide range of in-situ research applications, enabling simultaneous temperature control and atmospheric regulation.

Heating Cell
Technical Specifications
MaterialStainless Steel Body
Body Dimensions45 × 45 × 70 mm
Sample Holder16 mm diameter (pre-drilled hole)
WindowsDual Kapton windows with water cooling system
Heating Source6× Cartridge Heaters (8 mm OD, 250 W each)
Temperature Control
Maximum Operating Temperature973 K (700 °C)
Ramp Rate5–20 °C/min
ControllerEurotherm 2216e with K-type thermocouple
Stability± 0.1 K
Gas Atmosphere & Flow Control

The cell is designed to accommodate various gas environments for catalytic and material study.

Available GasesN2, O2, He, Ar, CO2 and H2
Flow ControlAALBORG Mass Flow Controllers (MFCs)
Flow Rate / Ranges0–100 sccm and 0–25 sccm

In-situ Battery System

In-situ battery cell

The cell structure consisted of a cap, anode, separator, cathode, spring, and case. The coin cell (CR2032) with an OD of 20 mm was used. To assemble the cell, an anode (Li foil, 0.75 mm thickness), separator (Celgard 2400, 25 μm thickness), cathode (LFP) and spring (stainless steel, 0.3 mm thickness) were provided. Since the case and cap were made from stainless steel, they did not allow X-ray transmission. Thus, an aperture with OD 8 mm sealed with Kapton film was provided.

Coin Cell Analyzer 5V10mA Battery Testing System

Technical Specifications
AC InputAC 220V ±10% 50Hz
Power25 W
ResolutionAD: 16 bit; DA: 12 bit
Input≥ 1 MΩ
CategoryParameterSpecification
VoltageMeasuring RangeCharge: 25 mV – 5 V
Discharge: 25 mV – 5 V
Discharge Min Voltage0 V
Accuracy± 0.1% of FS
Stability± 0.1% of FS
CurrentRangeCharge: 0.05 – 10 mA
Discharge: 0.05 – 10 mA
Accuracy± 0.1% of FS
Stability± 0.1% of FS
PowerOutput Power Per Channel0.05 W
Stability± 0.2% of FS
TimeRise Time1 ms (0 ~ Full Range)
Step Time≤ (365×24) hour/step
Time format 00:00:00 (h:min:s)
Data AcquisitionIntervalsΔt: 1 – 60000 s
ΔU: 10 mV – 5 V
ΔI: 0.02 – 10 mA
Frequency1 Hz
ChargeMode of OperationCCC, CVC, CC & CVC
End ConditionsVoltage, Current, Test Time, Capacity
DischargeMode of OperationCCD, CPD
End ConditionsVoltage, Current, Test Time, Capacity
CycleCycles65535
Steps63
Nested FunctionMax three levels of loops

Detector System

To measure XAS spectrum, the position sensitive detector (PSD) is used.

S3904-1024F — NMOS Linear Image Sensor with Scintillator (Hamamatsu Photonics K.K.)

NMOS linear image sensor consisting of 1024 pixels of an N-type diffusion layer formed on a P-type silicon substrate.

S3904-1024F sensor

Detection Method

The use of an indirect detection method, employing an X-ray scintillator (150 μm thick CsI (Cesium Iodide) coated on a fiber optic plate) to convert X-rays into visible light, extended the sensor lifetime to over a year.

NMOS sensor structureSensor close-up
ParameterSpecification
TypeCurrent output type (with FOP)
Image Size25.6 × 2.5 mm
Number of Effective Pixels1024 × 1 pixels
Pixel Size25 × 2500 μm
Spectral Response Range360 – 1000 nm
Line Rate (max.)1950 lines/s
CoolingNon-cooled
Window MaterialFiber optic plate
PackageCeramic
Measurement ConditionTyp. Ta = 25 ℃, unless otherwise noted

Source: Hamamatsu S3904-1024F

Absorption Edges Accessible at BL2.2

Elements marked with a + icon have standards available at BL2.2.