Check list before the application to the PES beamtime

(1) The most important thing is to submit the beamtime proposal before the deadline!
    - The safety and PI information are quite important to implement user's projects.
    - Note that all of proposals are reviewed and scored by external reviewers.
    - No proposal, no chance (except the industrial service, collaboration projects).
    - Clear description on why SR-XPS, and why not XAS, XRF, EPMA, mass spectrometry (SIMS, FABMS etc.) or XPS using AlKa?
    - The standalone XPS system is available in SUT-NANOTEC-SLRI BL5.1 XPS.

(2) Sample size must be large enough compared to the detection area.
    - XPS samples should be more than 5x5mm^2 at least. (See pictures)

    - XAS samples should be more than at least 5x5mm^2 larger than the beam size at XPS position.
    - Powders had better be attached as a pellet on carbon tape.

(3) Surface ex-situ impurities such as carbon and oxygen are negligible sometimes.
    - Handle with care on surface as clean as possible until loading sample into vacuum.
    - In-situ ion sputtering is available at XPS and PES, and PES has an sample heater.

(4) The sample surface needs to be conductive.
    - Surface must be conductive by doping or coating.

    - Charging effect might be reduced at lower photon flux, but more poor S/N.

(5) The probing target is whether surface or bulk.
    - Depth profile is required to get into bulk elements by ion sputtering method.
    - To do with ion sputtering, it is necesary to get more beamtime.

(6) The concentration of target elements in surface or bulk.
    - 1at% on surface is a detection limit in the low photon energy (BE < 100 eV).
    - To analyze the chemical states, 10% of element concentration is at least required.

(7) The binding energy of core levels and kinetic energy of Auger peaks.
    - Non overlapped spectral profile within the photon energy range (PE < 1000 eV) without sample charging condition.

    - The binding energy calibration is always required on the standard peaks or samples due to the instability of instruments.
    - The literature survey reported previously on samples by XPS may give us a great help to proceed the experiment.

(8) The chemical analysis by XPS or XAS in the total electron yield mode.
    - The standard samples are required to get information on chemical shifts.

    - XAS might be time-consuming experiment due to a slow undulator-gap changing speed.

Check list for the beamtime

(1) You need to have the ID card and radiation detector to get into our facility.
    - We are prepared for ID cards and radiation detectors for participants you described in your proposal.
    - Get ID cards and radiation detectors from the SLRI security guard in front of SLRI building (Contact the safety office if any problems).

(2) Sample must be prepared for UHV.
    - Loading samples into UHV takes at least an hour.
    - Visit the web on sample requirement.

(3) Local contacts assist your measurements.
    - Data can be served as ascii text or excel files.
    - The PES and PEEM annual workshop will be held for experts' help to data analysis.

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