Check list before the application to the PES beamtime
(1) The most important thing is to submit the beamtime proposal before the deadline!
- The safety and PI information are quite important to implement user's projects.
- Note that all of proposals are reviewed and scored by external reviewers.
- No proposal, no chance (except the industrial service, collaboration projects).
- Clear description on why SR-XPS, and why not XAS, XRF, EPMA, mass spectrometry (SIMS, FABMS etc.) or XPS using AlKa?
- The standalone XPS system is available in SUT-NANOTEC-SLRI BL5.1 XPS.
(2) Sample size must be large enough compared to the detection area.
- XPS samples should be more than 5x5mm^2 at least. (See pictures)
- XAS samples should be more than at least 5x5mm^2 larger than the beam size at XPS position.
- Powders had better be attached as a pellet on carbon tape.
(3) Surface ex-situ impurities such as carbon and oxygen are negligible sometimes.
- Handle with care on surface as clean as possible until loading sample into vacuum.
- In-situ ion sputtering is available at XPS and PES, and PES has an sample heater.
(4) The sample surface needs to be conductive.
- Surface must be conductive by doping or coating.
- Charging effect might be reduced at lower photon flux, but more poor S/N.
(5) The probing target is whether surface or bulk.
- Depth profile is required to get into bulk elements by ion sputtering method.
- To do with ion sputtering, it is necesary to get more beamtime.
(6) The concentration of target elements in surface or bulk.
- 1at% on surface is a detection limit in the low photon energy (BE < 100 eV).
- To analyze the chemical states, 10% of element concentration is at least required.
(7) The binding energy of core levels and kinetic energy of Auger peaks.
- Non overlapped spectral profile within the photon energy range (PE < 1000 eV) without sample charging condition.
- The binding energy calibration is always required on the standard peaks or samples due to the instability of instruments.
- The literature survey reported previously on samples by XPS may give us a great help to proceed the experiment.
(8) The chemical analysis by XPS or XAS in the total electron yield mode.
- The standard samples are required to get information on chemical shifts.
- XAS might be time-consuming experiment due to a slow undulator-gap changing speed.
Check list for the beamtime
(1) You need to have the ID card and radiation detector to get into our facility.
- We are prepared for ID cards and radiation detectors for participants you described in your proposal.
- Get ID cards and radiation detectors from the SLRI security guard in front of SLRI building (Contact the safety office if any problems).
(2) Sample must be prepared for UHV.
- Loading samples into UHV takes at least an hour.
- Visit the web on sample requirement.
(3) Local contacts assist your measurements.
- Data can be served as ascii text or excel files.
- The PES and PEEM annual workshop will be held for experts' help to data analysis.